The Help > Request Technical Support command now assists you by pre-loading important parameters into the support form, including the program name and version, its serial number, plus your operating system name and version.Ī new Help > Register CrystalDiffract command provides assistance in the registration process, supplying the program name, its serial number, and your operating system to the online registration form.Ī "serial number" is now displayed in the "About" screen ( CrystalDiffract > About CrystalMaker, Mac Help > About CrystalDiffract, Windows). This serial number is unique to your licence, and can be used in place of the licence code, when requesting technical support (please don't forget to specify "Mac" or "Windows" though!). #Crystaldiffract indeces update#Ī new CrystalDiffract > Apply Preferences command allows you to quickly update a diffraction window using the current preferences. You can, for example, edit simulation preferences such as the minimum d-spacings and maximum numbers of diffraction peaks, then have these applied to the current window. This saves having to load your data into a new window to take advantage of changed preferences. Improved handling of thermal ellipsoid data. When reading a CrystalMaker file, CrystalDiffract now verifies that at least one, valid, set of atomic displacement parameters ("thermal ellipsoids") is present. This improves performance for structures with no atomic displacement parameters. The Licence Agreement is now displayed using clearer text.Minor updates to the User's Guide, referring to the Patterns List.įixed an issue with the Preferences dialog, where the profile type wasn't being correctly set.Removed the (obsolete) "Relatives Intensities" checkbox from the Preferences dialog.Improved tickmarks for reciprocal d-spacing plots.The Edit Crystal sheet/dialog now clearly indicates absent temperature factor data, using a dot "." symbol. This is a major update, featuring dramatically faster and more efficient session files, significant improvements to the user interface, with the ability to duplicate and rename patterns, plus improved memory handling, a greatly-expanded new edition of the User's Guide, plus a myriad of performance enhancements and other changes.įast Session Files. Session files created by this version now include all reflexion data, thereby allowing near-instant loading of a saved experiment. (Previous versions saved structural data, but had to recalculate intensities as the session was loaded, which could take some time, especially for multi-structure sessions.)Īll Diffraction Patterns Saved. (Previously, only visible diffraction data were saved.) Any diffraction patterns which have been hidden (unchecked) are now automatically saved in the Session file. If a session contains one or more patterns which have never been plotted (i.e., they correspond to unprocessed crystal or data files), the program will - as an option - load each file and process the diffraction data, prior to saving the session file. #Crystaldiffract indeces serial number#.
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